Speed up your analysis of pharmaceutical impurities with SIFT-MS

by | Jan 17, 2018

Direct analysis using SIFT-MS, pharmaceutical applications, including formaldehyde analysis, residual solvents, packaging, residual monomer analysis

Direct MS offers benefits for the analysis of volatile impurities in pharmaceutical products. Interested? If so, why not learn how selected-ion flow-tube mass spectrometry can help...

Learn more about SIFT-MS for volatile impurity analysisVolatile compounds occur frequently as pharmaceutical impurites and are often of concern because of their toxicity. selected-ion flow-tube mass spectrometry (SIFT-MS) is a new tool for real-time, selective, and economical trace gas and headspace analysis of volatile compounds, including chromatographically challenging ones such as formaldehyde, formic acid, and ammonia.

Direct, broad-spectrum analysis using SIFT-MS provides new opportunities across multiple pharmaceutical applications, including:

  • simple formaldehyde analysis
  • residual solvent analysis
  • packaging screening, including residual monomer analysis

Separation Science, in collaboration with Syft Technologies and Anatune, is offering free access to an upcoming webinar that will describe:

  • the fundamentals of the selected ion flow tube mass spectrometry (SIFT-MS) technique, including its ability to selectively and comprehensively analyse samples in one, simple procedure
  • how SIFT-MS can greatly increase sample throughput for residual monomer and residual solvent analysis
  • from a formaldehyde case study— how SIFT-MS can eliminate sample preparation through direct analysis

Speakers.pngPresenters Vaughan Langford (Syft Technologies, New Zealand) and Mark Perkins (Anatune, UK) will explain to attendees how SIFT-MS revolutionises headspace and gas analysis through application of direct, ultra-soft chemical ionisation. Attend this webinar to learn how direct analysis using SIFT-MS can resolve longstanding throughput challenges for diverse pharmaceutical applications.

When?
This presentation will broadcast on 31 January, 2018, starting at 07.00 PST / 10.00 EST / 15.00 GMT / 16.00 CET.

To register simply click on the button below:

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